Assessment of reliability parameters of electronic components in rejection processes using clustering with wavelet transform. Інформатика. Культура. Техніка, [S. l.], v. 2, p. 23–27, 2025. DOI: 10.15276/ict.02.2025.02. Disponível em: https://ict.op.edu.ua/index.php/journal/article/view/7. Acesso em: 16 mar. 2026.