Assessment of reliability parameters of electronic components in rejection processes using clustering with wavelet transform

Abstract

Equipping critically important complex electronic systems with high-quality components is a necessary condition for
improving their reliability. Therefore, one of the key tasks is the determination of reliability parameters during the selection of components for mission-critical equipment. In this study, an enhancement of the procedure for determining reliability parameters is proposed through the use of a clustering method based on wavelet functions, which allows increasing the efficiency of the reliability parameter assessment procedure. The advantage of this approach lies in improving computational performance by setting constraints at the processing stage using the Haar wavelet in the extremum search area. Modeling confirmed the effectiveness of the proposed approach for determining reliability parameters, which makes it recommended for use in the selection of components for especially critical equipment